SLVAEX6 August 2020 – MONTH TPS55160-Q1 , TPS55162-Q1 , TPS55165-Q1
The failure mode distribution estimation for TPS5516x-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT no output (HiZ) | 25% |
| VOUT out of specification high | 20% |
| VOUT out of specification low | 20% |
| VOUT functional, out for specification timing | 30% |
| PG false trip, fails to trip | 5% |