SLVAFU8 July   2024 TPSI2072-Q1 , TPSI2140-Q1 , TPSI3050 , TPSI3050-Q1 , TPSI3052 , TPSI3052-Q1 , TPSI3100 , TPSI3100-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2What Are Solid-State Relays?
    1. 2.1 History
      1. 2.1.1 Electromechanical Relays
      2. 2.1.2 Solid-State Relays
    2. 2.2 Isolation Technologies
      1. 2.2.1 Isolation Specifications
    3. 2.3 Relay Evolution
  6. 3Failure Mechanisms
    1. 3.1 Arcing in an Electromechanical Relay
    2. 3.2 Photo-degradation in Photo Relays
    3. 3.3 Partial Discharge
    4. 3.4 Time-Dependent Dielectric Breakdown in Capacitive and Inductive Isolation
  7. 4Electromechanical vs. Photo vs. Capacitive or Inductive
    1. 4.1 Electromechanical Relays
      1. 4.1.1 Advantages
        1. 4.1.1.1 No Leakage Current
      2. 4.1.2 Limitations
        1. 4.1.2.1 Switching Speed
        2. 4.1.2.2 Package Size
    2. 4.2 Photo or Optical Relays
      1. 4.2.1 Advantages
        1. 4.2.1.1 Lower EMI
      2. 4.2.2 Limitations
        1. 4.2.2.1 Limited Temperature Range
    3. 4.3 Capacitive or Inductive Based Relays
      1. 4.3.1 Advantages
        1. 4.3.1.1 Auxiliary Power
        2. 4.3.1.2 Bidirectional Communication
      2. 4.3.2 Limitations
        1. 4.3.2.1 EMI
    4. 4.4 Overall Comparison
  8. 5Summary
  9. 6References

3 Failure Mechanisms

All solid-state relays and electromechanical relays can experience failure. A key difference in these faults are the failure mechanisms, which can vary for each device. This section explains the failure mechanisms found in electromechanical, photo, and capacitive/inductive technologies.