SLVAFU8 July   2024 TPSI2072-Q1 , TPSI2140-Q1 , TPSI3050 , TPSI3050-Q1 , TPSI3052 , TPSI3052-Q1 , TPSI3100 , TPSI3100-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2What Are Solid-State Relays?
    1. 2.1 History
      1. 2.1.1 Electromechanical Relays
      2. 2.1.2 Solid-State Relays
    2. 2.2 Isolation Technologies
      1. 2.2.1 Isolation Specifications
    3. 2.3 Relay Evolution
  6. 3Failure Mechanisms
    1. 3.1 Arcing in an Electromechanical Relay
    2. 3.2 Photo-degradation in Photo Relays
    3. 3.3 Partial Discharge
    4. 3.4 Time-Dependent Dielectric Breakdown in Capacitive and Inductive Isolation
  7. 4Electromechanical vs. Photo vs. Capacitive or Inductive
    1. 4.1 Electromechanical Relays
      1. 4.1.1 Advantages
        1. 4.1.1.1 No Leakage Current
      2. 4.1.2 Limitations
        1. 4.1.2.1 Switching Speed
        2. 4.1.2.2 Package Size
    2. 4.2 Photo or Optical Relays
      1. 4.2.1 Advantages
        1. 4.2.1.1 Lower EMI
      2. 4.2.2 Limitations
        1. 4.2.2.1 Limited Temperature Range
    3. 4.3 Capacitive or Inductive Based Relays
      1. 4.3.1 Advantages
        1. 4.3.1.1 Auxiliary Power
        2. 4.3.1.2 Bidirectional Communication
      2. 4.3.2 Limitations
        1. 4.3.2.1 EMI
    4. 4.4 Overall Comparison
  8. 5Summary
  9. 6References

3.3 Partial Discharge

The insulation material used in solid-state relays has defects known as internal voids. This allows for localized ionization, the process by which an atom gains a negative or positive charge by losing or gaining electrons when a high voltage rating is applied. As a result, the dielectric strength of the insulation material can breakdown, thus reducing the isolation rating of the device. This process is known as partial discharge (PD), and is applicable to most solid-state relays.

Internal Void Block Diagram Figure 3-3 Internal Void Block Diagram