SLVAFU8 July 2024 TPSI2072-Q1 , TPSI2140-Q1 , TPSI3050 , TPSI3050-Q1 , TPSI3052 , TPSI3052-Q1 , TPSI3100 , TPSI3100-Q1
Similar to photo relays, capacitive and inductive isolation technologies are subject to partial discharge. As a result, this phenomenon can be quantified to time-dependent dielectric breakdown (TDDB), the standard test method to verify the lifetime of any dielectric. Data can be gathered on a device’s time-dependent dielectric breakdown (TDDB) performance to characterize the expected failure rate.
As an example, here is the insulation lifetime projection data for the TPSI3050-Q1. The breakdown data is collected at various high-voltage ratings, displaying a relationship between fail time and VRMS.