SLVK086A january   2022  – may 2023 TPS7H4003-SEP

PRODUCTION DATA  

  1.   1
  2.   Single-Event Effects Test Report of the TPS7H4003-SEP Synchronous Step-Down Converter
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Appendix: Total Ionizing Dose From SEE Experiments
  15.   B Appendix: References
  16.   C Revision History

Trademarks

National Instruments™ and LabVIEW™ are trademarks of National Instruments.

HP-Z4® is a registered trademark of HP Inc.

All trademarks are the property of their respective owners.