SLVK117 October   2022 TPS7H2221-SEP

 

  1.   Single-Event Effects Test Report of the TPS7H2221-SEP Load Switch
  2.   Trademarks
  3. 1 Introduction
  4. 2 Single-Event Effects (SEE)
  5. 3 Device and Test Board Information
  6. 4 Irradiation Facility and Setup
  7. 5 Depth, Range and LETEFF Calculation
  8. 6 Test Setup and Procedures
  9. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  10. 8 Single-Event Transients (SET) and Single Event Functional Interrupt (SEFI)
    1. 8.1 Single Event Transient (SET)
    2. 8.2 Single Event Functional Interrupt (SEFI)
  11. 9 Event Rate Calculations
  12. 10Summary
  13.   A Appendix: Total Ionizing Dose from SEE Experiments
  14.   B Appendix: References

10 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the TPS7H2221-SEP load switch. Heavy-ions with LETEFF = 46.8 MeV·cm2/mg were were used for the SEE characterization campaign. Flux of 104 or 105 ions/cm2·s and fluences up to 3 x 106 or 1 × 107 ions/cm2 per run were used for the characterization. The SEE results demonstrated that the TPS7H2221-SEP load switch is free of destructive SEB events and SEL-free up to LETEFF = 46.8 MeV·cm2/mg and across the full electrical specifications. Transients at LETEFF = 46.8 MeV·cm2/mg on VOUT are presented and discussed. CREME96-based worst-week event-rate calculations for LEO(ISS) and GEO orbits for the DSEE are presented for reference.