SLVK117 October   2022 TPS7H2221-SEP

 

  1.   Single-Event Effects Test Report of the TPS7H2221-SEP Load Switch
  2.   Trademarks
  3. 1 Introduction
  4. 2 Single-Event Effects (SEE)
  5. 3 Device and Test Board Information
  6. 4 Irradiation Facility and Setup
  7. 5 Depth, Range and LETEFF Calculation
  8. 6 Test Setup and Procedures
  9. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  10. 8 Single-Event Transients (SET) and Single Event Functional Interrupt (SEFI)
    1. 8.1 Single Event Transient (SET)
    2. 8.2 Single Event Functional Interrupt (SEFI)
  11. 9 Event Rate Calculations
  12. 10Summary
  13.   A Appendix: Total Ionizing Dose from SEE Experiments
  14.   B Appendix: References

A Appendix: Total Ionizing Dose from SEE Experiments

The production TPS7H2221-SEP Load Switch is radiation lot acceptance tested (RLAT) to a total ionizing dose (TID) of 20 krad(Si) (characterized to 30 krad(Si)). In the course of the SEE testing, the heavy-ion exposures delivered ≈10 krad(Si) per 107 ions/cm2 run. The cumulative TID exposure over all runs was determined to be between 3 krad(Si) to 20 krad(Si), for each device. All production TPS7H2221-SEP devices sued in the study described in this report were fully-functional after the heavy-ion SEE testing campaign.