SLVK147A August   2023  – September 2023 TPS7H2201-SEP

PRODUCTION DATA  

  1.   1
  2.   Trademarks
  3. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  4. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  5. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 TPS7H2201-SEP Specification Compliance Matrix
  6. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  7. 5Revision History
  8.   A Appendix: HDR TID Report Data

Test Description and Facilities

The TPS7H2201-SEP HDR exposure was performed on biased and unbiased devices in a Co-60 gamma cell at TI facility in Dallas CLAB (DCLAB), Texas. The unattenuated dose rate of this cell is 200 rads(Si)/s. After exposure, the devices were packed in dry ice (per MIL-STD-883 Method 1019.9 section 3.10) and brought to Junkins lab in TI Dallas for full post-radiation electrical evaluation using Texas Instruments ATE. ATE test limits are set per data sheet electrical limits based on preliminary qualification and characterization data. Post-radiation measurements were taken within 30 minutes of removing the devices from the dry ice container. The devices were allowed to reach room temperature prior to electrical post-radiation measurements.