SLVK152B August   2023  – November 2023 TPS7H2140-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Data Sheet Electrical Parameters
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: HDR TID Report
  9.   B Appendix B: LDR TID Report
  10.   C Revision History

Abstract

This report discusses the results of the total-ionizing dose (TID) testing for the Texas Instruments TPS7H2140-SEP. The TPS7H2140-SEP device is a fully protected quad-channel eFuse with four integrated 160-mΩ NMOS power FETs. Full diagnostics and high-accuracy current sense enables intelligent control of the loads. An external adjustable current limit improves the reliability of whole system by limiting the inrush or overload current.

The study was done to determine TID effects under high dose rate (HDR) and low dose rate (LDR) up to 30 krad(Si). The results show that all samples passed within the specified limits up to 30 krad(Si) for HDR and LDR.