SLVK162A December   2023  – August 2024 TPS7H6003-SP , TPS7H6013-SP , TPS7H6023-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Neutron Displacement Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Facility
    3. 2.3 Test Setup Details
  6. 3Test Results
    1. 3.1 NDD Characterization Summary
    2. 3.2 Data Sheet Electrical Parameters and Associated Tests
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: NDD Report Data
  9.   B Revision History

1.2 Device Details

Table 1-1 lists the device information and test conditions used in the NDD characterization.

Table 1-1 Device and Exposure Details
NDD Exposure Details
TI Device TPS7H6003-SP
TI Part Name 5962R2220101VXC
Device Function Half Bridge Gate Driver
Package 48-pin CFP (HBX)
Technology LBC7
Lot Number and Date Code 3008205 / 2324A
Sample Quantity 9 + 1 control unit
Exposure Facility Fast Neutron Irradiation (FNI) Facility of University of Massachusetts Lowell Research Reactor (UMLRR)
Neutron Fluence (1-MeV equivalent) Level 1 × 1012, 5 × 1012, 1 × 1013 n/cm2
Irradiation Temperature 25°C
TPS7H6003-SP TPS7H6003-SP Device Used in Exposure Figure 1-1 TPS7H6003-SP Device Used in Exposure