SLVK162A December   2023  – August 2024 TPS7H6003-SP , TPS7H6013-SP , TPS7H6023-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Neutron Displacement Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Facility
    3. 2.3 Test Setup Details
  6. 3Test Results
    1. 3.1 NDD Characterization Summary
    2. 3.2 Data Sheet Electrical Parameters and Associated Tests
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: NDD Report Data
  9.   B Revision History

Abstract

This report presents the effect of neutron displacement damage (NDD) on the TPS7H6003-SP,TPS7H6013-SP and TPS7H6023-SP devices. This platform of devices show a strong degree of hardness to neutron irradiation up to fluence level 1 × 1013 n/cm2.

The neutron irradiation test is a destructive test. Test procedure follows MIL-STD-883 method 1017 as guidance. The purpose of this test is to determine the device susceptibility to non-ionizing energy loss (NIEL) degradation. Objectives of the test are, to detect and measure the degradation of critical device parameters as a function of neutron fluence and to determine if these parameters are within specified limits after exposure to a specified level of neutron fluence.