SLVK163
November 2023
TPS7H6003-SP
PRODUCTION DATA
1
Abstract
Trademarks
1
Device Information
1.1
Product Description
1.2
Device Details
2
Total Dose Test Setup
2.1
Test Overview
2.2
Test Description and Facilities
2.3
Test Setup Details
2.3.1
Unbiased
2.3.2
Biased
2.4
Test Configuration and Condition
3
TID Characterization Test Results
3.1
TID Characerization Results Summary
3.2
Data Sheet Electrical Parameters
4
Applicable and Reference Documents
4.1
Applicable Documents
4.2
Reference Documents
A Appendix: HDR TID Report
4.1
Applicable Documents
Texas Instruments,
TPS7H6003-SP Radiation-Hardness-Assured 200-V, 1.3-A, 2.5-A, Half-Bridge GaN FET Gate Driver
, data sheet.
Texas Instruments,
TPS7H6003EVM-CVAL Evaluation Module user's guide
, EVM user's guide.
Texas Instruments,
TPS7H6003-SP Single-Event Effects (SEE) Report
, radiation report.