SLVK169 May   2024 TPS7H1121-SP

 

  1.   1
  2.   Trademarks
  3. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  4. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Conditions
  5. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 TPS7H1121-SP Data Sheet Electrical Parameters
  6. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  7.   A Appendix: HDR TID Report Data

1.2 Device Details

Table 1-1 lists the device information used in the TID HDR characterization.

Table 1-1 Device and Exposure Details
TID HDR Details: Up to 100krad(Si)
TI Device NumberTPS7H1121-SP (5962R2320301VXC)
Package22 PIN HFT
TechnologyLinear BiCMOS 7 (LBC7)
Die Lot Number3300911
A/T Lot Number / Date Code4000460 / 2407A
Quantity Tested10 irradiated units
Lot Accept/RejectAll levels tested and passed up to 100krad(Si)
HDR Radiation FacilityDCLAB - Texas Instruments, Dallas, TX
HDR Dose Level100krad (Si)
HDR Dose Rate182.92rad / s
HDR Radiation SourceGammacell 220 Excel (GC-220E) Co-60
Irradiation TemperatureAmbient, room temperature
Device Used in Exposure (Front)Figure 1-1 Device Used in Exposure (Front)
Device Used in Exposure (Back)Figure 1-2 Device Used in Exposure (Back)