The purpose of this study is to characterize the Single-Event Effects (SEE) performance due to heavy-ion irradiation of the TPS7H3014-SP. Heavy-ions with LETEFF of 75MeV·cm2/mg were used to irradiate production devices. Flux of ≈8 × 104 ions/cm2·s and fluence of ≈107 ions/cm2 per run were used for the characterization. The results demonstrate the TPS7H3014-SP is SEL-free and SEB/SEGR-free at T = 125°C and T = 25°C, respectively. The TPS7H3014-SP was also tested for SET at T = 25°C, results demonstrate the device is SET-free.
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The TPS7H3014-SP is an integrated 3V to 14V, four channel radiation-hardness assured power-supply sequencer. The channel count can be incremented as needed for the application by connecting multiple ICs in a daisy-chain configuration. The device features sequence up and reverse sequence down control signals (UP and DOWN), SEQ-DONE and PWRGD flags to monitor the sequence and power status of the monitored power tree. Other features for the device include:
The device is offered in a 14-pin ceramic package. General device information and test conditions are listed in Table 1-1. For more detailed technical specifications, user-guides, and application notes please go to TPS7H3014-SP product page.
| DESCRIPTION(1) | DEVICE INFORMATION |
|---|---|
| TI Part Number | TPS7H3014-SP |
| Orderable Number | 5962R23201VXC |
| Device Function | 4-channel sequencer |
| Technology | LBC7 (Linear BiCMOS 7) |
| Exposure Facility | Radiation Effects Facility, Cyclotron Institute, Texas A&M University (15MeV/nucleon) |
| Heavy Ion Fluence per Run | 1.00 × 107 ions/cm2 |
| Irradiation Temperature | 25°C (for SEB/SEGR testing), 25°C (for SET testing), and 125°C (for SEL testing) |