SLVK173 July   2024 TPS7H4011-SP

 

  1.   1
  2.   TPS7H4011-SP Single-Event Effects (SEE)
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

7.1 Single-Event Latch-up (SEL) Results

During the SEL testing the device was heated to 125°C by using a Closed-Loop PID controlled heat gun (MISTRAL 6 System (120V, 2400W)). The temperature of the die was verified using thermal camera prior to exposure to heavy ions.

The species used for the SEL testing was Holmium (165Ho at 15MeV/nucleon). For the 165Ho ion an incidence angle of 0° was used to achieve an LETEFF = 75MeV·cm2 / mg (For more details, see Ion LETEFF, Depth, and Range in Silicon). The kinetic energy in the vacuum for this ions is 2.474GeV. Flux of approximately 5 × 104 ions/cm2× s and a fluence of approximately 107 ions/cm2 per run was used. Run duration to achieve this fluence was approximately four minutes. The four devices were powered up and exposed to the heavy-ions using the maximum recommended input voltage of 14V with the maximum recommended load of 12A. No SEL events were observed during all four runs, indicating that the TPS7H4011-SP is SEL-free up to 75MeV × cm2/mg. Table 8-4 shows the SEL test conditions and results. Figure 7-1 shows a plot of the current versus time for run 1.

Table 7-1 Summary of TPS7H4011-SP SEL Test Condition and Results
Run NumberUnit NumberIonLETEFF (MeV × cm2/mg)Flux (ions × cm2/mg)Fluence (Number ions)VINIOUT (A)SEL (# Events)
11165Ho753.09 × 1041 x 10714120
22165Ho755.58 × 1041 x 10714120
33165Ho755.95 × 1041 x 10714120
44165Ho756.93 × 1041 × 10714120
Using the MFTF method shown in Single-Event Effects (SEE) Confidence Interval Calculations and combining (or summing) the fluences of the four runs at 125°C (4 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as: σSEL ≤ 9.22 × 10-8 cm2/ device for LETEFF = 75MeV × cm2/ mg and T = 125°C.
SEL Current versus Time for Run 1 of the TPS7H4011-SP at T = 125°C (VOUT = 3.3V)Figure 7-1 SEL Current versus Time for Run 1 of the TPS7H4011-SP at T = 125°C (VOUT = 3.3V)