SLVK173 July 2024 TPS7H4011-SP
During the SEL testing the device was heated to 125°C by using a Closed-Loop PID controlled heat gun (MISTRAL 6 System (120V, 2400W)). The temperature of the die was verified using thermal camera prior to exposure to heavy ions.
The species used for the SEL testing was Holmium (165Ho at 15MeV/nucleon). For the 165Ho ion an incidence angle of 0° was used to achieve an LETEFF = 75MeV·cm2 / mg (For more details, see Ion LETEFF, Depth, and Range in Silicon). The kinetic energy in the vacuum for this ions is 2.474GeV. Flux of approximately 5 × 104 ions/cm2× s and a fluence of approximately 107 ions/cm2 per run was used. Run duration to achieve this fluence was approximately four minutes. The four devices were powered up and exposed to the heavy-ions using the maximum recommended input voltage of 14V with the maximum recommended load of 12A. No SEL events were observed during all four runs, indicating that the TPS7H4011-SP is SEL-free up to 75MeV × cm2/mg. Table 8-4 shows the SEL test conditions and results. Figure 7-1 shows a plot of the current versus time for run 1.
Run Number | Unit Number | Ion | LETEFF (MeV × cm2/mg) | Flux (ions × cm2/mg) | Fluence (Number ions) | VIN | IOUT (A) | SEL (# Events) |
---|---|---|---|---|---|---|---|---|
1 | 1 | 165Ho | 75 | 3.09 × 104 | 1 x 107 | 14 | 12 | 0 |
2 | 2 | 165Ho | 75 | 5.58 × 104 | 1 x 107 | 14 | 12 | 0 |
3 | 3 | 165Ho | 75 | 5.95 × 104 | 1 x 107 | 14 | 12 | 0 |
4 | 4 | 165Ho | 75 | 6.93 × 104 | 1 × 107 | 14 | 12 | 0 |