SLVK173 July   2024 TPS7H4011-SP

 

  1.   1
  2.   TPS7H4011-SP Single-Event Effects (SEE)
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

1 Introduction

The TPS7H4011-SP is a 14V, 12A synchronous buck converter optimized for use in a space environment. The peak current mode converter obtains high efficiency with good transient performance and reduced component count.

The wide voltage range of the TPS7H4011-SP enables the device to be used as a point of load regulator to convert directly from a 12V or 5V rail. The output voltage start-up ramp is controlled by the SS_TR pin. Power sequencing is possible with the EN and PWRGD pins.

The device can be configured with up-to four devices in parallel without an external clock for increased current capabilities. Additionally, various features are included such as differential remote sensing, selectable current limit, a flexible fault input pin, and configurable compensation.

The device is offered in a 30-pin ceramic package. General device information and test conditions are listed in Table 1-1. For more detailed technical specifications, user guides, and application notes, see TPS7H4011-SP product page.

Table 1-1 Overview Information
Description (1)Device Information
TI Part NumberTPS7H4011-SP
Orderable Number5962R2122101VXC
Device FunctionSynchronous Buck Converter
TechnologyLBC7 (Linear BiCMOS 7)
Exposure FacilityRadiation Effects Facility, Cyclotron Institute, Texas A&M University (15 MeV/nucleon)
Heavy Ion Fluence per Run1.00 × 107 ions / cm2
Irradiation Temperature25°C (for SEB/SEGR testing), 25°C (for SET testing), and 125°C (for SEL testing)
(1) TI may provide technical, applications or design advice, quality characterization, and reliability data or service, providing these items shall not expand or otherwise affect TI's warranties as set forth in the Texas Instruments Incorporated Standard Terms and Conditions of Sale for Semiconductor Products and no obligation or liability shall arise from Semiconductor Products and no obligation or liability shall arise from TI's provision of such items.