SLVK175 August   2024 TPS7H5002-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: Specifications Requiring Clarification
  9.   B Appendix: HDR TID Report Data

1.2 Device Details

Table 1-1 lists the device information used in the initial TID HDR characterization.

Table 1-1 Device and Exposure Details
TID Exposure Details
TI DeviceTPS7H5002-SP

QMLP

TI Part Name5962R1822202PYE
Package24-pin TSSOP
TechnologyLBC7
Quantity Tested50
Lot Accept/RejectAll levels tested and passed up to 100 krad(Si)
HDR Radiation FacilityTexas Instruments - Dallas, TX
HDR Dose Level3 krad(Si), 10 krad(Si), 30 krad(Si), 50 krad(Si), 100 krad(Si)
HDR Dose Rate175.827 rads(Si)/s (175.824 to 175.830 rad(Si)/s)
HDR Radiation SourceGammacell (Hopewell, GR420) Co-60
Irradiation TemperatureAmbient room temperature
TPS7H5002-SP QMLP Device Photo Figure 1-1 TPS7H5002-SP QMLP Device Photo