SLVK177 August   2024 TPS7H5004-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: Specifications Requiring Clarification
  9.   B Appendix: HDR TID Report Data

Abstract

This report discusses the results of the total ionizing dose (TID) testing for TPS7H5004-SP QMLP, Texas Instruments 4V to 14V radiation-hardness-assured, current mode, dual output PWM controller optimized for DC-DC converters. The study was done to determine TID effects under high dose rate (HDR) up to 100krad(Si). The results show that all samples passed within the specified limits up to 100krad(Si).