SLVK178 September 2024 TPS7H1121-SP
HDR devices were stressed at 100krad(Si) for biased and unbiased conditions.
Total Samples: 25 | ||||
---|---|---|---|---|
Exposure Levels | ||||
3 krad(Si) | 10 krad(Si) | 30 krad(Si) | 50 krad(Si) | 100 krad(Si) |
175, 176, 178, 179, 180 | 170. 171. 172. 173. 174 | 164, 165, 166, 168, 169 | 127, 128, 129, 130, 132 | 121, 123, 124, 125, 126 |
Total Samples: 25 | ||||
---|---|---|---|---|
Exposure Levels | ||||
3 krad(Si) | 10 krad(Si) | 30 krad(Si) | 50 krad(Si) | 100 krad(Si) |
54, 55, 57, 58, 59 | 82, 83, 84, 85, 87 | 94, 95, 97,98, 99 | 105, 107, 108, 109, 110 | 149, 150, 151, 152, 153 |