SLVK178 September   2024 TPS7H1121-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Conditions
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 TPS7H1121-SP Data Sheet Electrical Parameters
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: HDR TID Report Data

Abstract

This report discusses the total ionizing dose (TID) parametric results for TPS7H1121-SP, Texas Instruments, 2.25V to 14V input, radiation-hardness-assured 2A low-dropout (LDO) regulator. The study was done to determine the TID effects under high dose rate (HDR) up to 100krad(Si). The results show that all samples passed within the specified limits up to 100krad(Si).