SLVK179 September   2024 TPS7H1121-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Facility
    3. 2.3 Test Setup Details
    4. 2.4 Test Configuration and Condition
  6. 3NDD Characterization Test Results
    1. 3.1 NDD Characterization Summary
    2. 3.2 Data Sheet Electrical Parameter Characteristics
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: NDD Report Data

3.2 Data Sheet Electrical Parameter Characteristics

Over 2.25V ≤ VIN ≤ 14V, VOUT (set) ≤ VIN – 0.5V, IOUT = 10mA, COUT = 47µF, typical values are at TA = 25°C, unless otherwise noted.

ParameterTest ConditionsMINTYPMAXUNITTest Number
POWER SUPPLIES AND CURRENTS
VDODropout voltage VDO = VIN(forced) – VOUT(set)VOUT(set) = 2.25V, VOUT(measured) = 98% × VOUT(NOM)IOUT = 100mA2860mV17.3
IOUT= 250mA7014117.6
IOUT= 500mA15028017.9
IOUT = 1A30057017.12
VOUT(set) = 2.5V, VOUT(measured) = 98% × VOUT(NOM)IOUT= 1.5A525750mV17.15
IOUT= 2A57090017.18
3 ≤ VOUT(set) ≤ 13.3V, VOUT(measured) = 98% × VOUT(NOM)IOUT= 100mA2050mV17.21, 17.24
IOUT= 250mA7010017.27, 17.30
IOUT = 500mA12518017.33, 17.36
IOUT = 1A30034017.39, 17.42
IOUT = 1.5A32549017.45, 17.48
IOUT = 2A50070017.51, 17.54
IPCLProgrammed current limitVIN = 3.3V, VOUT(short) = 0.1VRCL = 442kΩ0.190.320.45A16.1
RCL = 174kΩ0.4850.75

1.01

16.2
RCL = 82.5kΩ1.161.551.9416.3
RCL = 41.2kΩ2.433.616.4
IQQuiescent currentVEN = 7V, IOUT = 0A8.7515mA11.7, 11.9, 11.12
IGNDGround currentVEN = 7VIOUT = 1A1018mA11.13, 11.14
IOUT = 2A1320mA11.15, 11.16, 11.17
VLDOInternal linear regulator output voltageVIN = 2.25V2.052.22.25V15.7
3V ≤ VIN ≤ 14V2.32.552.78

15.64

ISHDNShutdown currentVEN = 0V, IOUT = 0A, VOUT = 0V380775µA11.1, 11.2, 11.3, 11.4, 11.5, 11.6
IFBFeedback leakage currentVFB = 0.7V115nA15.80
ACCURACY
VACCOutput voltage accuracy10mA ≤IOUT ≤ 2A, 0.6V ≤ VOUT ≤ VIN – VDO, PD ≤ 3W3V ≤ VIN ≤ 14V-1.5%1.5%
3V ≤ VIN ≤ 14V, TA = 25°C-1.1%1.1%

15.44, 15.57, 15.62, 15.68, 15.73, 15.78

2.25V ≤ VIN ≤ 3V-1.8%1.8%

15.5, 15.11, 15.16, 15.21, 15.26, 15.31

VFBFeedback voltage3V ≤ VIN ≤ 14V0.5880.5960.606V
TA = 25°C0.5910.5960.603

15.36, 15.40, 15.45, 15.49, 15.53, 15.63, 15.74, 15.79

2.25V ≤ VIN ≤ 3V0.5860.5960.608

15.6, 15.12, 15.17, 15.22, 15.27, 15.32

ΔVOUT/ ΔVINLine regulation3V ≤ Vln ≤ 14V100650µV/V18.5
2.25V ≤ Vln ≤ 3V285180018.4
ΔVOUT/ ΔIOUTLoad regulation10mA ≤ IOUT ≤ 2A, VIN = 4.5V, VOUT = 3.3V416mV/A19.5
ENABLE
VEN(rising)Enable rising threshold (turn-on)0.5650.6050.625V13.1, 13.4, 13.7, 13.10, 13.13, 13.16, 13.19
VEN(falling)Enable falling threshold (turn-off)0.4650.50.52V13.2, 13.5, 13.8, 13.11, 13.14, 13.17, 13.20
tEN(delay)EN propogation delayEN high to VOUT = 10mV50150µs13.24, 13.25, 13.26, 13.27, 13.28, 13.29, 13.30, 13.31, 13.32, 13.33
IEN(LKG)Enable leakage currentVEN = 7V130nA13.22, 13.23
POWER GOOD
VPG_RISEPower good rising as percent of VOUT93%95%97%14.1, 14.4, 14.7, 14.10, 14.13, 14.16
VPG_FALLPower good falling as percent of VOUT88.5%91.5%94%14.2, 14.5, 14.8, 14.11, 14.14, 14.17
VPG(OL)Power good output lowIPG(SINK) = 2mA90190mV14.19, 14.20
VIN(MIN_PG)Minimum VIN for valid PG (VPG < 0.5V)IPG(SINK) = 0.5mA0.60.8V14.21
IPG(LKG)Power good leakageVPG = 7V, VFB = 0.7V0.052µA14.22, 14.23
SOFT START
ISSSoft-start current1.422.7µA20.1, 20.2
tSSSoft-start timeVIN = 5V, VOUT = 3.3V, measured from VOUT = 10mV to PG assertCSS = 1nF0.220.350.48ms20.3
CSS = 33nF5.51014.520.4
STABILITY
GMGain MarginVIN = 5V, VOUT = 3.3V, IOUT = 1A, COUT = 47µF, TA = 25℃24dB
PMPhase MarginVIN = 5V, VOUT = 3.3V, IOUT = 1A, COUT = 47µF, TA = 25 ℃60o
NOISE AND PSRR
PSRRPower-supply rejection ratioVIN = 5V, VOUT = 3.3V, IOUT = 1A, CSS = 5.6nFfripple = 100Hz68dB
fripple = 1kHz72
fripple = 10kHz51
fripple = 100kHz40
fripple = 1MHz34
VNOutput noise voltage (Bandwidth from 10Hz to 100kHz)VIN = 5V, VOUT = 3.3V, IOUT = 1A, CSS = 5.6nF

35

µVRMS