4 Revision History
Changes from Revision J (December 2019) to Revision K (July 2022)
- Updated the numbering format for tables, figures, and
cross-references throughout the documentGo
Changes from Revision I (December 2016) to Revision J (December 2019)
- Changed DRV package pinout image to show thermal pad outline and
transparent top view Go
Changes from Revision H (October 2015) to Revision I (December 2016)
- Changed CIN from: 4.7 mF To: 4.7 µF and CO From: 1 mF To: 1 µF in the Typical Application Schematic
Go
Changes from Revision G (December 2014) to Revision H (October 2015)
- Added 500 µs/div label to X-axis of Figure 8-4. Go
Changes from Revision F (December 2010) to Revision G (December 2014)
- Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information sectionGo