SLVSFI1A July   2021  – December 2021 TPS1HC100-Q1

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1. 5.1 Recommended Connections for Unused Pins
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 SNS Timing Characteristics
    7. 6.7 Switching Characteristics
    8. 6.8 Typical Characteristics
  7. 7 Parameter Measurement Information
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Accurate Current Sense
      2. 8.3.2 Programmable Current Limit
        1. 8.3.2.1 Capacitive Charging
      3. 8.3.3 Inductive-Load Switching-Off Clamp
      4. 8.3.4 Full Protections and Diagnostics
        1. 8.3.4.1  Short-Circuit and Overload Protection
        2. 8.3.4.2  Open-Load and Short-to-Battery Detection
        3. 8.3.4.3  Short-to-Battery Detection
        4. 8.3.4.4  Reverse-Polarity and Battery Protection
        5. 8.3.4.5  Latch-Off Mode
        6. 8.3.4.6  Thermal Protection Behavior
        7. 8.3.4.7  UVLO Protection
        8. 8.3.4.8  Loss of GND Protection
        9. 8.3.4.9  Loss of Power Supply Protection
        10. 8.3.4.10 Reverse Current Protection
        11. 8.3.4.11 Protection for MCU I/Os
      5. 8.3.5 Diagnostic Enable Function
    4. 8.4 Device Functional Modes
      1. 8.4.1 Working Mode
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Dynamically Changing Current Limit
        2. 9.2.2.2 AEC Q100-012 Test Grade A Certification
        3. 9.2.2.3 EMC Transient Disturbances Test
      3. 9.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
      1. 11.2.1 Without a GND Network
      2. 11.2.2 With a GND Network
    3. 11.3 Thermal Considerations
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Support Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

9.2.3 Application Curves

Figure 9-5 shows a test example of charging a 470-μF capacitor. Test conditions: VBB = 13.5 V, input is from low to high, load is a 470-µF capacitive load, ILIM pin is shorted to GND. CH4 is the output current. CH3 is the input step. CH2 is the output voltage, VOUT. CH1 is the supply voltage, VBB

Figure 9-6 shows a test example of a enable into short-circuit inrush current limit. Test conditions: VBB= 13.5 V, input is low to high, load is 5 µH + 100 mΩ, ILIM pin is shorted to GND. CH4 is the output current. CH3 is the input step. CH2 is the output voltage, VOUT. CH1 is the supply voltage, VBB

Figure 9-7 shows a test example of a load step from 500 mA to 3 A back to 500 mA. Test conditions: VBB= 13.5 V, input is high, load is 6.75 Ω and then changed to 4.5 Ω then back to 6.75 Ω, ILIM pin is shorted to GND. CH4 is the output current. CH3 is the SNS pin. CH2 is the output voltage, VOUT. CH1 is the supply voltage, VBB

GUID-20211201-SS0I-BBJD-HFMC-ZS4LJG8TKGGR-low.pngFigure 9-5 Charging a 470-μF Capacitor
GUID-20211201-SS0I-XBJV-RHLS-R0KQ4PHBSSBH-low.pngFigure 9-7 Load Step
GUID-20211201-SS0I-ZRXV-NP3X-FWNKB0DXB5DD-low.pngFigure 9-6 Enable into Short Circuit