SLVSHB5A October   2024  – November 2024 TPS61287

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Enable and Start-up
      2. 6.3.2 Undervoltage Lockout (UVLO)
      3. 6.3.3 Programmable EN/UVLO
      4. 6.3.4 Switching Valley Current Limit
      5. 6.3.5 External Clock Synchronization
      6. 6.3.6 Stackable Multi-phase Operation
      7. 6.3.7 Device Functional Modes
        1. 6.3.7.1 Forced PWM Mode
        2. 6.3.7.2 Auto PFM Mode
      8. 6.3.8 Overvoltage Protection
      9. 6.3.9 Thermal Shutdown
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
        1. 7.2.2.1 Setting Output Voltage
        2. 7.2.2.2 Inductor Selection
        3. 7.2.2.3 Bootstrap And VCC Capacitors Selection
        4. 7.2.2.4 MOSFET Selection
        5. 7.2.2.5 Input Capacitor Selection
        6. 7.2.2.6 Output Capacitor Selection
        7. 7.2.2.7 Loop Stability
      3. 7.2.3 Application Curves
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
        1. 7.4.2.1 Thermal Considerations
  9. 8 Device and Documentation Support
    1. 8.1 Receiving Notification of Documentation Updates
    2. 8.2 Support Resources
    3. 8.3 Trademarks
    4. 8.4 Electrostatic Discharge Caution
    5. 8.5 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

8.4 Electrostatic Discharge Caution

TPS61287 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.