SLVUBU4 March 2021
Test point labeled DGATE (TP4) is used for monitoring gate voltage of Q2 and HGATE (TP3) is used for gate voltage of Q1. Test Point labelled VIN (TP1) measures input voltage, VOUT (TP2) measure output voltage. Test Point labelled VA (TP6) measures the source voltage of Q1 and Q2 MOSFETs which is also connected to the A pin. Test Points GND1, GND3 and GND4 provides access to the input GND voltage and GND2 provides access to the LM74800-Q1 GND pin.
Connector | Description |
---|---|
J1 | Power input connector to the positive rail of the input power supply |
J3 | Ground connection for the power supply |
J2 | Power output connector to the positive side of the load |
J4 | Ground connection for the load |
Test Points | Description |
---|---|
VIN | Input power supply to the EVM |
VOUT | Output from the EVM |
VA | Common-source point of Q1 and Q2 MOSFETs and A pin of LM7480x-Q1 |
DGATE | Output of Ideal Diode MOSFET Gate Control |
HGATE | Output of Hot-Swap MOSFET Gate Control |
GND1, GND 2, GND3 and GND4 | Test Point for EVM Ground |
Jumpers | Description |
---|---|
J5 | EN/UVLO Control
|
J6 | OVP Setting
|
J7 | Enables LED indication for output |