SLVUCB8A May   2022  – September 2022 TPS25985

 

  1.   TPS25985 evaluation module for eFuse User's Guide
  2.   Trademarks
  3. 1Introduction
    1. 1.1 EVM Features
    2. 1.2 EVM Applications
  4. 2Description
  5. 3Schematic
  6. 4General Configurations
    1. 4.1 Physical Access
    2. 4.2 Test Equipment and Setup
      1. 4.2.1 Power supplies
      2. 4.2.2 Meters
      3. 4.2.3 Oscilloscope
      4. 4.2.4 Loads
  7. 5Test Setup and Procedures
    1. 5.1  Hot Plug
    2. 5.2  Start-up with Enable
    3. 5.3  Difference Between Current Limit and DVDT Based Start-up Mechanisms
    4. 5.4  Power-up into Short
    5. 5.5  Overvoltage Lockout
    6. 5.6  Transient Overload Performance
    7. 5.7  Overcurrent Event
    8. 5.8  Provision to Apply Load Transient and Overcurrent Event Using an Onboard Switching Circuit
    9. 5.9  Output Hot Short
    10. 5.10 PROCHOT# Implementation Using General-Purpose Comparator
    11. 5.11 Quick Output Discharge (QOD)
    12. 5.12 Thermal Performance of TPS25985EVM
  8. 6EVAL Board Assembly Drawings and Layout Guidelines
    1. 6.1 PCB Drawings
  9. 7Bill Of Materials (BOM)
  10. 8Revision History

1 Introduction

The TPS25985EVM eFuse Evaluation Board allows reference circuit evaluation of Texas Instruments (TI) TPS25985 eFuse. The TPS25985 device is a 4.5-V to 16-V and 60-A (RMS) stackable eFuse with an accurate and fast current monitoring capability. This device supports the parallel connection of multiple eFuses for higher current designs by actively synchronizing the device states and sharing the loads during start-up and steady state. The TPS25985 eFuse has an integrated FET with ultra-low ON resistance of 0.59-mΩ, adjustable and robust overcurrent and short-circuit protections, precise load current monitoring, fast overvoltage protection (fixed 16.7-V threshold), adjustable output slew rate control for inrush current protection, and built-in overtemperature protection to ensure FET safe operating area (SOA). TPS25985 eFuse also has an adjustable overcurrent transient blanking timer to support load transients, adjustable under-voltage protection, integrated FET health monitoring, and reporting, analog die temperature monitor output, dedicated fault and power good indication pins, and an uncommitted general-purpose fast comparator.