This EVM has the following features:
- Input core voltage VDD supports 2.5-V rail and
3.3-V rail
- VLDOIN, VDDQ voltage range: 0.9 V–3.5 V
- Dynamic performance evaluation features:
- Sink and source integrated load switches for transient load step
emulation
- Configurable load step
and slew rate control by on-board resistors
CAUTION: The
default EVM configuration using the built-in transient test circuit
supports testing the DDR4 at ±1.5 A, DDR3 at ±1.875 A, DDR2 at ±2.25
A. To evaluate the DDR node, or different currents for DDR2, DDR3,
DDR3L, and DDR4 the total resistance of resistors R6-R9, and R17-R20
needs to be changed to not exceed device maximum
ratings.
- Jumper J14 (pins 1 and 2) for device enable.
(enabled without J14 installed)
- Convenient test points for probing PGOOD, CLK_IN,
and loop response testing
- Optional placeholders for VDDQSNS to VLDOIN filter when not using independent
VDDQSNS source