8 Revision History
Changes from Revision * (January 2023) to Revision A (July 2023)
- Updated document to new templateGo
- Changed the EVM photoGo
- Added Device Information
Go
- Added EVM Description
Go
- Changed Setup with new information on high-voltage and low-voltage
testingGo
- Added information to EVM Performance Validation
sectionGo
- Added AEF Design Flow
sectionGo
- Added AEF Circuit Optimization and Debug
sectionGo
- Changed EMI performance result in Figure 4-1
Go
- Added CM insertion loss plotGo
- Added SENSE and INJ Voltages
Go
- Added film capacitor alternative for CINJ
Go