Here are some considerations and best
practices to optimize AEF circuit operation:
- If the EMI measurement with AEF enabled is not
performing as expected, then probe the TPSF12C3 INJ pin voltage
while the regulator is switching. Verify that the INJ voltage is not
getting clipped near the positive or negative supply rails, as
mentioned in step 4 of Section 2.4.
- If the
INJ voltage is getting clipped, then increase the
regulator-side Y-capacitance and/or the inject
capacitance. Then recheck loop stability using the
TPSF12C3 quickstart calculator or
by simulation.
- The metallic chassis structure is a
critical part of the overall filter implementation. The filter PCB typically mounts
to the chassis structure using several screw attachments, and the chassis serves to
connect the various GND nodes on the filter PCB. These nodes are not explicitly
connected with PCB copper and instead rely on the chassis to complete the electrical
connection. As such, the chassis becomes the lowest impedance return path for CM
noise current.
- When testing a power system that includes a
chassis as illustrated in Figure 3-3, CM noise can capacitively couple to the
reference ground plane of the EMI measurement setup
and thus bypass a filter circuit that is not closely
referenced to this ground plane. In this case, TI
recommends bonding the GND plane of the filter EVM
directly to the ground plane of the setup. This also
serves to minimize parasitic inductance in the GND
connection to the AEF circuit. CM noise current
emanating from the power stage then gets
recirculated by the low shunt impedance of the
Y-capacitors (both active and passive), thereby
preventing noise from reaching the LISN.
- Based on the amplification of the
effective Y-capacitance, AEF enables a reduction of the CM choke inductance while
maintaining the same LC corner frequency and CM attenuation characteristic. However,
a choke with reduced CM inductance and smaller size typically has a lower leakage
inductance, which is responsible for DM attenuation along with the X-capacitors.
- If the DM inductance is
significantly reduced when using smaller CM chokes, then increase the
X-capacitance or add a small discrete inductor to obtain sufficient DM
attenuation. Otherwise, a high DM noise component (relative to the CM
component) can dominate the total noise measurement, thereby concealing the
impact of AEF on CM noise mitigation.
- Typical values for the sense and inject
capacitances are 680 pF and 22 nF, respectively. Depending on the
final implementation in the target application, the default
damping and compensation component values installed on the
EVM may require modification by the user to achieve
acceptable loop stability. Ferrite chokes are inherently
more difficult to stabilize than nanocrystalline types.
- For
additional context pertaining to component selection
and circuit optimization, refer to the TPSF12C3 product data
sheet and the TPSF12C3 quickstart
calculator.