SLVUCT9 January 2024
Primary Device |
Secondary Device |
||||
---|---|---|---|---|---|
Designator |
Function |
Designator |
Function |
||
J10 |
VIN_P |
Power input connector for VIN of the primary device. |
R42 |
VIN_S |
0 Ohm resistor for tying VIN of the primary and secondary devices. |
TP3 |
Test point |
TP22 |
Test point |
||
J5 |
PULL_UP1_P |
Power input connector for PULL_UP1 of the primary device. | R41 |
PULL_UP1_S |
0 Ohm resistor for tying PULL_UP1 of the primary and secondary devices. |
TP5 |
Test point |
TP24 |
Test point |
||
J2 |
PULL_UP2_P |
Power input connector for PULL_UP2 of the primary device. | R38 |
PULL_UP2_S |
0 Ohm resistor for tying PULL_UP2 of the primary and secondary devices. |
TP7 |
Test point |
TP35 |
Test point |
||
J6, J23 |
GND |
Power input connector for GND of the primary device. | GND power connections are shared between primary and secondary devices. |
||
TP26, TP27, TP28, TP29, TP30, TP31, TP32, TP33 |
Test point |
||||
J24 |
VOUT1_P |
Input connector for an external VOUT rail to be monitored by SENSE1 of the primary device. |
J55 |
VOUT1_S |
Input connector for an external VOUT rail to be monitored by SENSE1 of the secondary device. |
J31 |
GND |
J62 |
GND |
||
J28 |
SENSE1_P |
Probe test point |
J57 |
SENSE1_S |
|
TP13 |
Test point |
TP38 |
Test point | ||
J25 |
VOUT2_P |
Input connector for an external VOUT rail to be monitored by SENSE2 of the primary device. | J56 |
VOUT2_S |
Input connector for an external VOUT rail to be monitored by SENSE2 of the secondary device. |
J32 |
GND |
J63 |
GND |
||
J29 |
SENSE2_P |
Probe test point |
J58 |
SENSE2_S |
Probe test point |
TP14 |
Test point |
TP39 |
Test point | ||
J33 |
VOUT3_P |
Input connector for an external VOUT rail to be monitored by SENSE3 of the primary device. | J65 |
VOUT3_S |
Input connector for an external VOUT rail to be monitored by SENSE3 of the secondary device. |
J39 |
GND |
J70 |
GND |
||
J37 |
SENSE3_P |
Probe test point |
J68 |
SENSE3_S |
Probe test point |
TP18 |
Test point |
TP45 |
Test point |
||
J34 |
VOUT4_P |
Input connector for an external VOUT rail to be monitored by SENSE4 of the primary device. | J66 |
VOUT4_S |
Input connector for an external VOUT rail to be monitored by SENSE4 of the secondary device. |
J40 |
GND |
J71 |
GND |
||
J38 |
SENSE4_P |
Probe test point |
J69 |
SENSE4_S |
Probe test point |
TP19 |
Test point |
TP46 |
Test point |
||
TP1 |
EN1_P |
Test point |
TP20 |
EN1_S |
Test point |
J3 |
Probe test point |
J42 |
Probe test point | ||
J1 |
Output connector for EN1 of the primary device. |
J41 |
Output connector for EN1 of the secondary device. | ||
J4 |
GND |
J43 |
GND |
||
TP2 |
EN2_P |
Test point |
TP21 |
EN2_S |
Test point |
J8 |
Probe test point |
J45 |
Probe test point | ||
J7 |
Output connector for EN2 of the primary device. | J44 |
Output connector for EN2 of the secondary device. | ||
J9 |
GND |
J46 |
GND |
||
TP4 |
EN3_P |
Test point |
TP23 |
EN3_S |
Test point |
J12 |
Probe test point |
J48 |
Probe test point | ||
J11 |
Output connector for EN3 of the primary device. | J47 |
Output connector for EN3 of the secondary device. | ||
J13 |
GND |
J49 |
GND |
||
TP8 |
EN4_P |
Test point |
TP34 |
EN4_S |
Test point |
J18 |
Probe test point |
J51 |
Probe test point | ||
J14 |
Output connector for EN4 of the primary device. | J50 |
Output connector for EN4 of the secondary device. | ||
J22 |
GND |
J52 |
GND |
||
J15, J16, J17 |
DLY_TMR_P |
Shunt for DLY_TMR resistor configuration of the primary device. |
J53 |
DLY_TMR_S |
Shunt for DLY_TMR resistor configuration of the secondary device. |
J19, J20, J21 |
REG_TMR_P |
Shunt for REG_TMR resistor configuration of the primary device. |
J54 |
REG_TMR_S |
Shunt for REG_TMR resistor configuration of the secondary device. |
TP11 |
UP_P |
Test point |
TP41 |
UP_S |
Test point |
J26 |
Probe test point |
J60 |
Probe test point | ||
TP17 |
DOWNb_P |
Test point |
TP42 |
DOWNb_S |
Test point |
J36 |
Probe test point |
J61 |
Probe test point | ||
TP6 |
HYS_P |
Test point |
TP25 |
HYS_S |
Test point |
TP15 |
FAULTb_P |
Test point |
TP43 |
FAULTb_S |
Test point |
J30 |
Probe test point |
J64 |
Probe test point | ||
TP16 |
SEQ_DONE_P |
Test point |
TP44 |
SEQ_DONE_S |
Test point |
J35 |
Probe test point |
J67 |
Probe test point | ||
TP12 |
PWRGD_P |
Test point |
TP40 |
PWRGD_S |
Test point |
J27 |
Probe test point |
J59 |
Probe test point | ||
TP9 |
VLDO_P |
Test point |
TP36 |
VLDO_S |
Test point |
TP10 |
REFCAP_P |
Test point |
TP37 |
REFCAP_S |
Test point |
TP47 |
RESET |
Test point |
External RESET will apply to both the primary and secondary device. |