SNAK013 November   2022 LMK04832-SEP

 

  1.   Abstract
  2.   Trademarks
  3. 1Product Description
  4. 2Test Setup
    1. 2.1 SEL Test
    2. 2.2 SEFI Test
    3. 2.3 Test Facility
  5. 3Results
    1. 3.1 SEL Results
    2. 3.2 SEFI Results
  6. 4Summary
  7. 5References

5 References

  1. Texas Instruments, LMK04832-SEP Space Grade Ultra-Low-Noise JESD204B/C Dual-Loop Clock Jitter Cleaner data sheet
  2. Texas Instruments, How Space-Enhanced Plastic devices address challenges in low-Earth orbit applications E2E™ forum, Sree Alvarado, 2019
  3. Texas Instruments, JESD204B Overview Texas Instruments High Speed Data Converter Training
  4. Vendor Item Drawing V62/22612, Depart. of Defense, DLA Land and Maritime, Columbus OH, https://landandmaritimeapps.dla.mil/programs/Smcr/default.aspx
  5. Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices From Heavy Ion Irradiation, EIA/JESD57
  6. Texas Instruments, LMK04832SEPEVM User's Guide
  7. "Cyclotron Institute, Texas A&M University," http://cyclotron.tamu.edu/ref