SNAK020 January   2024 LMX1906-SP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Test Method
  6. 3Results
  7. 4References
  8.   A RLAT Data and Plots

1 Overview

The LMX1906-SP (5962R2320201PXE)(1) uses the BC13 wafer fab process which has been shown not to exhibit Enhanced Low Dose Rate Sensitivity (ELDRS)(2). Per MIL-STD-883 Test Method 1019(3), if a BiCMOS product is on a process that is shown to be ELDRS-free, Total Ionizing Dose (TID) Radiation Lot Acceptance Testing (RLAT) can be performed at high dose rate (HDR). In the case of BC13, HDR testing is the worst-case condition and covers low dose rate (LDR) applications.

For RLAT of a wafer lot, the sample size is five units per MIL-PRF-38535 (4).