SNAK022
May 2024
LMX1860-SEP
1
LMX1860-SEP Single-Event Effects Test Report
Trademarks
1
Product Description
2
Test Setup
2.1
SEL Test
2.2
SEFI Test
2.3
Test Facility
3
Results
3.1
SEL Results
3.2
SEFI Results
4
Summary
5
References
5
References
Texas Instruments,
LMX860-SEP Space Grade Low-Noise, High-Frequency JESD204B/C Buffer, Multiplier and Divider
, data sheet.
Texas Instruments,
Reduce the Risk in Low-Earth Orbit Missions with Space Enhanced Plastic Products
, application note.
Department of Defense, DLA Land and Maritime,
Vendor Item Drawing V62/22612
, webpage.
Texas Instruments,
LMX860EVM User's Guide
, EVM user's guide.
UC Berkeley,
The Berkeley Accelerator Space Effects (BASE) Facility
, webpage.
Texas A&M University,
Cyclotron Institute TAMU Radiation Effects Facility (Control Software Download Page)
, webpage.
JEDEC,
Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices From Heavy Ion Irradiation
, webpage.