SNAS668E
August 2015 – September 2024
LMK03328
PRODUCTION DATA
1
1
Features
2
Applications
3
Description
4
Device Comparison
5
Pin Configuration and Functions
6
Specifications
6.1
Absolute Maximum Ratings
6.2
ESD Ratings
6.3
Recommended Operating Conditions
6.4
Thermal Information
6.5
Thermal Information
6.6
Electrical Characteristics - Power Supply
6.7
Pullable Crystal Characteristics (SECREF_P, SECREF_N)
6.8
Non-Pullable Crystal Characteristics (SECREF_P, SECREF_N)
6.9
Clock Input Characteristics (PRIREF_P/PRIREF_N, SECREF_P/SECREF_N)
6.10
VCO Characteristics
6.11
PLL Characteristics
6.12
1.8-V LVCMOS Output Characteristics (OUT[7:0])
6.13
LVCMOS Output Characteristics (STATUS[1:0]
6.14
Open-Drain Output Characteristics (STATUS[1:0])
6.15
AC-LVPECL Output Characteristics
6.16
AC-LVDS Output Characteristics
6.17
AC-CML Output Characteristics
6.18
HCSL Output Characteristics
6.19
Power-On/Reset Characteristics
6.20
2-Level Logic Input Characteristics (HW_SW_CTRL, PDN, GPIO[5:0])
6.21
3-Level Logic Input Characteristics (REFSEL, GPIO[3:1])
6.22
Analog Input Characteristics (GPIO[5])
6.23
I2C-Compatible Interface Characteristics (SDA, SCL)
6.24
Typical 156.25-MHz, Closed-Loop Output Phase Noise Characteristics
6.25
Typical 161.1328125-MHz, Closed-Loop Output Phase Noise Characteristics
6.26
Closed-Loop Output Jitter Characteristics
6.27
PCIe Clock Output Jitter
6.28
Typical Power Supply Noise Rejection Characteristics
6.29
Typical Power Supply Noise Rejection Characteristics
6.30
Typical Closed-Loop Output Spur Characteristics
6.31
Typical Characteristics
7
Parameter Measurement Information
7.1
Test Configurations
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
Device Block-Level Description
8.3.2
Device Configuration Control
8.3.2.1
Hard Pin Mode (HW_SW_CTRL = 1)
8.3.2.1.1
PLL Blocks
8.3.2.1.2
Output Buffer Auto Mute
8.3.2.1.3
Input Block
8.3.2.1.4
Channel Mux
8.3.2.1.5
Output Divider
8.3.2.1.6
Output Driver Format
8.3.2.1.7
Status MUX, Divider and Slew Rate
8.3.2.2
Soft Pin Programming Mode (HW_SW_CTRL = 0)
8.3.2.2.1
Device Config Space
8.3.2.2.2
PLL Blocks
8.3.2.2.3
Output Buffer Auto Mute
8.3.2.2.4
Input Block
8.3.2.2.5
Channel Mux
8.3.2.2.6
Output Divider
8.3.2.2.7
Output Driver Format
8.3.2.2.8
Status MUX, Divider, and Slew Rate
8.3.2.3
Register File Reference Convention
8.4
Device Functional Modes
8.4.1
Smart Input MUX
8.4.2
Universal Input Buffer (PRI_REF, SEC_REF)
8.4.3
Crystal Input Interface (SEC_REF)
8.4.4
Reference Doubler
8.4.5
Reference (R) Divider
8.4.6
Input (M) Divider
8.4.7
Feedback (N) Divider
8.4.8
Phase Frequency Detector (PFD)
8.4.9
Charge Pump
8.4.10
Loop Filter
8.4.11
VCO Calibration
8.4.12
Fractional Circuitry
8.4.12.1
Programmable Dithering Levels
8.4.12.2
Programmable Delta Sigma Modulator Order
8.4.13
Post Divider
8.4.14
High-Speed Output MUX
8.4.15
High-Speed Output Divider
8.4.16
High-Speed Clock Outputs
8.4.17
Output Synchronization
8.4.18
Status Outputs
8.4.18.1
Loss of Reference
8.4.18.2
Loss of Lock (LOL)
8.5
Programming
8.5.1
I2C Serial Interface
8.5.2
Block Register Write
8.5.3
Block Register Read
8.5.4
Write SRAM
8.5.5
Write EEPROM
8.5.6
Read SRAM
8.5.7
Read EEPROM
8.5.8
Read ROM
8.5.9
Default Device Configurations in EEPROM and ROM
9
Register Maps
9.1
LMK03328 Registers
9.1.1
VNDRID_BY1 Register; R0
9.1.2
VNDRID_BY0 Register; R1
9.1.3
PRODID Register; R2
9.1.4
REVID Register; R3
9.1.5
PARTID Register; R4
9.1.6
PINMODE_SW Register; R8
9.1.7
PINMODE_HW Register; R9
9.1.8
TARGETADR Register; R10
9.1.9
EEREV Register; R11
9.1.10
DEV_CTL Register; R12
9.1.11
INT_LIVE Register; R13
9.1.12
INT_MASK Register; R14
9.1.13
INT_FLAG_POL Register; R15
9.1.14
INT_FLAG Register; R16
9.1.15
INTCTL Register; R17
9.1.16
OSCCTL2 Register; R18
9.1.17
STATCTL Register; R19
9.1.18
MUTELVL1 Register; R20
9.1.19
MUTELVL2 Register; R21
9.1.20
OUT_MUTE Register; R22
9.1.21
STATUS_MUTE Register; R23
9.1.22
DYN_DLY Register; R24
9.1.23
REFDETCTL Register; R25
9.1.24
STAT0_INT Register; R27
9.1.25
STAT1 Register; R28
9.1.26
OSCCTL1 Register; R29
9.1.27
PWDN Register; R30
9.1.28
OUTCTL_0 Register; R31
9.1.29
OUTCTL_1 Register; R32
9.1.30
OUTDIV_0_1 Register; R33
9.1.31
OUTCTL_2 Register; R34
9.1.32
OUTCTL_3 Register; R35
9.1.33
OUTDIV_2_3 Register; R36
9.1.34
OUTCTL_4 Register; R37
9.1.35
OUTDIV_4 Register; R38
9.1.36
OUTCTL_5 Register; R39
9.1.37
OUTDIV_5 Register; R40
9.1.38
OUTCTL_6 Register; R41
9.1.39
OUTDIV_6 Register; R42
9.1.40
OUTCTL_7 Register; R43
9.1.41
OUTDIV_7 Register; R44
9.1.42
CMOSDIVCTRL Register; R45
9.1.43
CMOSDIV0 Register; R46
9.1.44
CMOSDIV1 Register; R47
9.1.45
STATUS_SLEW Register; R49
9.1.46
IPCLKSEL Register; R50
9.1.47
IPCLKCTL Register; R51
9.1.48
PLL1_RDIV Register; R52
9.1.49
PLL1_MDIV Register; R53
9.1.50
PLL2_RDIV Register; R54
9.1.51
PLL2_MDIV Register; R55
9.1.52
PLL1_CTRL0 Register; R56
9.1.53
PLL1_CTRL1 Register; R57
9.1.54
PLL1_NDIV_BY1 Register; R58
9.1.55
PLL1_NDIV_BY0 Register; R59
9.1.56
PLL1_FRACNUM_BY2 Register; R60
9.1.57
PLL1_FRACNUM_BY1 Register; R61
9.1.58
PLL1_FRACNUM_BY0 Register; R62
9.1.59
PLL_FRACDEN_BY2 Register; R63
9.1.60
PLL1_FRACDEN_BY1 Register; R64
9.1.61
PLL1_FRACDEN_BY0 Register; R65
9.1.62
PLL1_MASHCTRL Register; R66
9.1.63
PLL1_LF_R2 Register; R67
9.1.64
PLL1_LF_C1 Register; R68
9.1.65
PLL1_LF_R3 Register; R69
9.1.66
PLL1_LF_C3 Register; R70
9.1.67
PLL2_CTRL0 Register; R71
9.1.68
PLL2_CTRL1 Register; R72
9.1.69
PLL2_NDIV_BY1 Register; R73
9.1.70
PLL2_NDIV_BY0 Register; R74
9.1.71
PLL2_FRACNUM_BY2 Register; R75
9.1.72
PLL2_FRACNUM_BY1 Register; R76
9.1.73
PLL2_FRACNUM_BY0 Register; R77
9.1.74
PLL2_FRACDEN_BY2 Register; R78
9.1.75
PLL2_FRACDEN_BY1 Register; R79
9.1.76
PLL2_FRACDEN_BY0 Register; R80
9.1.77
PLL2_MASHCTRL Register; R81
9.1.78
PLL2_LF_R2 Register; R82
9.1.79
PLL2_LF_C1 Register; R83
9.1.80
PLL2_LF_R3 Register; R84
9.1.81
PLL2_LF_C3 Register; R85
9.1.82
XO_MARGINING Register; R86
9.1.83
XO_OFFSET_GPIO5_STEP_1_BY1 Register; R88
9.1.84
XO_OFFSET_GPIO5_STEP_1_BY0 Register; R89
9.1.85
XO_OFFSET_GPIO5_STEP_2_BY1 Register; R90
9.1.86
XO_OFFSET_GPIO5_STEP_2_BY0 Register; R91
9.1.87
XO_OFFSET_GPIO5_STEP_3_BY1 Register; R92
9.1.88
XO_OFFSET_GPIO5_STEP_3_BY0 Register; R93
9.1.89
XO_OFFSET_GPIO5_STEP_4_BY1 Register; R94
9.1.90
XO_OFFSET_GPIO5_STEP_4_BY0 Register; R95
9.1.91
XO_OFFSET_GPIO5_STEP_5_BY1 Register; R96
9.1.92
XO_OFFSET_GPIO5_STEP_5_BY0 Register; R97
9.1.93
XO_OFFSET_GPIO5_STEP_6_BY1 Register; R98
9.1.94
XO_OFFSET_GPIO5_STEP_6_BY0 Register; R99
9.1.95
XO_OFFSET_GPIO5_STEP_7_BY1 Register; R100
9.1.96
XO_OFFSET_GPIO5_STEP_7_BY0 Register; R101
9.1.97
XO_OFFSET_GPIO5_STEP_8_BY1 Register; R102
9.1.98
XO_OFFSET_GPIO5_STEP_8_BY0 Register; R103
9.1.99
XO_OFFSET_SW_BY1 Register; R104
9.1.100
XO_OFFSET_SW_BY0 Register; R105
9.1.101
PLL1_CTRL2 Register; R117
9.1.102
PLL1_CTRL3 Register; R118
9.1.103
PLL1_CALCTRL0 Register; R119
9.1.104
PLL1_CALCTRL1 Register; R120
9.1.105
PLL2_CTRL2 Register; R131
9.1.106
PLL2_CTRL3 Register; R132
9.1.107
PLL2_CALCTRL0 Register; R133
9.1.108
PLL2_CALCTRL1 Register; R134
9.1.109
NVMSCRC Register; R135
9.1.110
NVMCNT Register; R136
9.1.111
NVMCTL Register; R137
9.1.112
NVMLCRC Register; R138
9.1.113
MEMADR_BY1 Register; R139
9.1.114
MEMADR_BY0 Register; R140
9.1.115
NVMDAT Register; R141
9.1.116
RAMDAT Register; R142
9.1.117
ROMDAT Register; R143
9.1.118
NVMUNLK Register; R144
9.1.119
REGCOMMIT_PAGE Register; R145
9.1.120
POR_CTRL Register; R173
9.1.121
XOCAPCTRL_BY1 Register; R199
9.1.122
XOCAPCTRL_BY0 Register; R200
9.2
EEPROM Map
10
Application and Implementation
10.1
Application Information
10.1.1
Jitter Considerations in SERDES Systems
10.1.2
Frequency Margining
10.1.2.1
Fine Frequency Margining
10.1.2.2
Coarse Frequency Margining
10.2
Typical Applications
10.2.1
Application Block Diagram Examples
10.2.1.1
Design Requirements
10.2.1.2
Detailed Design Procedure
10.2.1.2.1
Device Selection
10.2.1.2.1.1
Calculation Using LCM
10.2.1.2.2
Device Configuration
10.2.1.2.3
PLL Loop Filter Design
10.2.1.2.3.1
PLL Loop Filter Design
10.2.1.2.4
PLL and Clock Output Assignment
10.2.1.2.5
Spur Mitigation Techniques
10.2.1.2.5.1
Phase Detector Spurs
10.2.1.2.5.2
Integer Boundary Fractional Spurs
10.2.1.2.5.3
Primary Fractional Spurs
10.2.1.2.5.4
Sub-Fractional Spurs
10.3
Power Supply Recommendations
10.3.1
Device Power-Up Sequence
10.3.2
Device Power-Up Timing
10.3.3
Power Down
10.3.4
Power Rail Sequencing, Power Supply Ramp Rate, and Mixing Supply Domains
10.3.4.1
Mixing Supplies
10.3.4.2
Power-On Reset
10.3.4.3
Powering Up From Single-Supply Rail
10.3.4.4
Powering Up From Split-Supply Rails
10.3.4.5
Slow Power-Up Supply Ramp
10.3.4.6
Non-Monotonic Power-Up Supply Ramp
10.3.4.7
Slow Reference Input Clock Start-Up
10.3.5
Power Supply Bypassing
10.4
Layout
10.4.1
Layout Guidelines
10.4.1.1
Assess Thermal Reliability
10.4.1.2
Support for PCB Temperature up to 105°C
10.4.2
Layout Example
11
Device and Documentation Support
11.1
Documentation Support
11.1.1
Related Documentation
11.2
Receiving Notification of Documentation Updates
11.3
Support Resources
11.4
Trademarks
11.5
Electrostatic Discharge Caution
11.6
Glossary
12
Revision History
13
Mechanical, Packaging, and Orderable Information
2
Applications
Switches and Routers
Network and Telecom Line Cards
Servers and Storage Systems
Wireless Base Station
PCIe Gen1, Gen2, Gen3, Gen4, Gen5, Gen6
Test and Measurement
Broadcast Infrastructure