SNAS734F July 2017 – January 2024 CDCI6214
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
fIN_Xtal | Crystal frequency | Fundamental mode | 8 | 50 | MHz | |
ZESR | Crystal equivalent series resistance | A supported crystal is within | 30 | 100 | Ω | |
CL | Crystal load capacitance | Using on-chip load capacitance. A supported crystal is within. | 5 | 8 | pF | |
PXTAL | Crystal tolerated drive power | A supported crystal tolerates up to | 100 | uW | ||
CXIN_LOAD | On-Chip load capacitance | Programmable in typical 200-fF steps at room temp | 3 | 9.1 | pF | |
DNLXIN_LOAD | Differential non-linearity | at room temp | 200 | fF |