The TMP9R00-SP HDR exposure was performed on biased and unbiased devices in a Co-60 gamma cell at TI SVA facility in Santa Clara, California. The un-attenuated dose rate of this cell is 65 rad(Si)/s. After exposure, the devices were packed in dry ice (per MIL-STD-883 Method 1019.9 section 3.10) and returned to TI Dallas for a full post-radiation electrical evaluation using Texas Instruments ATE. ATE guard-band test limits are set within Standard Microcircuit Drawing (SMD) electrical limits to ensure a minimum Cpk and test error margin based on initial qualification and characterization data. Post radiation measurements were taken within 30 minutes of removal of the devices from the dry ice container. The devices were allowed to reach room temperature prior to electrical post radiation measurements.

TheTMP9R00-SP low dose rate (LDR) exposure was performed on biased and unbiased devices in a Co60 gamma cell under a 10-mrad(Si)/s exposure rate. The dose rate of the irradiator used in the exposure ranges from < 10 mrad(Si)/s to a maximum of approximately 84 rad(Si)/s, determined by the distance from the source. For the LDR (10 mrad(Si)/s) exposure, the test box was positioned approximately 2 m from the source. The exposure boards are housed in a lead-aluminum box (as specified in MIL-STD-883 TM 1019.9) to harden the gamma spectrum and minimize dose enhancement effects. The irradiator calibration is maintained by Logmire Laboratories using Thermoluminescence Dosimeters (TLDs) traceable to the National Institute of Standards and Technology (NIST) and the dosimetry was verified using TLDs prior to the radiation exposures. ATE guard band test limits are set within SMD electrical limits to ensure a minimum Cpk and test error margin based on initial qualification and characterization data.