6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
|
MIN |
MAX |
UNIT |
Supply Voltage |
–0.2 |
12 |
V |
Output Voltage |
−1 |
(+VS + 0.6) |
V |
Output Current |
|
10 |
mA |
Maximum Junction Temperature, TJMAX |
|
150 |
°C |
Storage temperature, Tstg |
−65 |
150 |
°C |
(1) Stresses beyond those listed under may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under . Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
6.5 Electrical Characteristics
Unless otherwise noted, these specifications apply for VS = 5 VDC and ILOAD = 0.5 μA, in the circuit of Figure 14. All limits TA = TJ = 25°C, unless otherwise noted.
PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX(1) |
UNIT
|
Accuracy(2) |
|
–3 |
|
3 |
°C |
TA = TMAX |
–4 |
|
4 |
°C |
TA = TMIN |
–4 |
|
4 |
°C |
Non-linearity(3) |
TA = TJ = TMIN to TMAX |
–0.8 |
|
0.8 |
°C |
Sensor Gain (Average Slope) |
TA = TJ = TMIN to TMAX |
9.7 |
|
10.3 |
mV/°C |
Output Resistance |
|
|
2000 |
|
Ω |
TA = TJ = TMIN to TMAX |
|
|
4000 |
Line Regulation(4) |
4.5 V ≤ VS ≤ 10 V |
–0.8 |
|
0.8 |
mV/V |
TA = TJ = TMIN to TMAX |
–1.2 |
|
1.2 |
mV/V |
Quiescent Current(5) |
4.5 V ≤ VS ≤ 10 V |
|
|
130 |
μA |
4.5 V ≤ VS ≤ 10 V TA = TJ = TMIN to TMAX |
|
|
180 |
μA |
Change of Quiescent Current(5) |
4.5 V ≤ VS ≤ 10 V TA = TJ = TMIN to TMAX |
|
|
2 |
μA |
Temperature Coefficient of Quiescent Current |
TA = TJ = TMIN to TMAX |
|
2 |
|
μA/°C |
Long Term Stability(6) |
TJ = 125°C, for 1000 hours |
|
±0.08 |
|
°C |
(1) Limits are specific to TI's AOQL (Average Outgoing Quality Level).
(2) Accuracy is defined as the error between the output voltage and 10 mv/°C times the device's case temperature plus 500 mV, at specified conditions of voltage, current, and temperature (expressed in °C).
(3) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device's rated temperature range.
(4) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(5) Quiescent current is defined in the circuit of
Figure 14.
(6) For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur. The majority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after 1000 hours will not continue at the first 1000 hour rate.