SNIS189D June   2015  – June 2018 LMT01

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
    1.     LMT01 Accuracy
  3. 3 Description
    1.     2-Pin IC Temperature Sensor
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Electrical Characteristics - TO-92/LPG Pulse Count to Temperature LUT
    7. 6.7  Electrical Characteristics - WSON/DQX Pulse Count to Temperature LUT
    8. 6.8  Switching Characteristics
    9. 6.9  Timing Diagram
    10. 6.10 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Output Interface
      2. 7.3.2 Output Transfer Function
      3. 7.3.3 Current Output Conversion to Voltage
    4. 7.4 Device Functional Modes
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Mounting, Temperature Conductivity, and Self-Heating
    2. 8.2 Typical Application
      1. 8.2.1 3.3-V System VDD MSP430 Interface - Using Comparator Input
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 Setting the MSP430 Threshold and Hysteresis
        3. 8.2.1.3 Application Curves
    3. 8.3 System Examples
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Receiving Notification of Documentation Updates
    2. 11.2 Community Resources
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

11.4 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.