All trademarks are the property of their respective owners.
This section provides Failure In Time (FIT) rates for LMT86-Q1 based on two different industry-wide used reliability standard. Table 1-1 provides FIT rates based on IEC TR 62380 / ISO 26262 part 11.
FIT IEC TR 62380 / ISO 26262 | FIT (Per 109 Hours) |
---|---|
Total Component FIT Rate | 4 |
Die FIT Rate | 2 |
Package FIT Rate | 2 |
The failure rate and mission profile information in Table 1-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
The failure mode distribution estimation for LMT86-Q1 in Table 2-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgments.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
VOUT open (HIZ) | 15% |
VOUT short to VDD | 20% |
VOUT short to GND | 20% |
VOUT not in specification | 45% |