SNOA475F October   2016  – September 2020 LMV791

 

  1.   Trademarks
  2. 1Introduction
  3. 2What Parameters Should Be Tested?
    1. 2.1  Open-Loop Gain (AOL) and Phase Margin
    2. 2.2  Slew Rate
    3. 2.3  Common-Mode Rejection Ratio (CMRR) and Power Supply Rejection Ratio (PSRR)
    4. 2.4  Open-Loop Output Impedance (Zo)
    5. 2.5  Voltage Noise (en)
    6. 2.6  Current Noise (in)
    7. 2.7  Input Offset Voltage (VOS), Input Bias Current (Ib), and Quiescent Current (IQ)
    8. 2.8  Output Voltage Versus Output Current (Claw Curve)
    9. 2.9  Overload Recovery Time (tOR)
    10. 2.10 Common-mode Input Capacitance (CCM) and Common-mode Differential Capacitance (CDIFF)
    11. 2.11 Overshoot and Transient Response
    12. 2.12 Common-Mode Voltage Range (CMVR)
  4. 3Conclusion
  5.   Revision History

3 Conclusion

The test circuits described above are not meant to replace the evaluation of the device on the bench. Rather, they provide the user with the flexibility of making quick assessments with respect to the accuracy of the macro model.

Special thanks to the applications group and the design community at Texas Instruments for their thoughtful insights.