SNOK010 November   2024 TPS7H6005-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the TPS7H6005-SEP, TPS7H6015-SEP, and TPS7H6025-SEP. Heavy-ions with LETEFF of 48 MeV × cm2/mg was used to irradiate twelve production devices. Flux of approximately 105 ions/cm2×s and fluence of approximately 107 ions/cm2 per run were used for the characterization. The results demonstrate the performance of the TPS7H60x5-SEP under SEL and SEB and SEGR conditions at T = 125°C and T = 25°C, respectively. SET transients performance for output pulse width excursions ≥ |20%| from the nominal width and positive and negative edge transients on HO and LO are presented and discussed.