SNOK012
December 2024
TPS7H6005-SEP
1
Abstract
Trademarks
1
Device Information
1.1
Product Description
1.2
Device Details
2
Total Dose Test Setup
2.1
Test Overview
2.2
Test Facility
2.3
Test Setup Details
2.4
Test Configuration and Condition
3
NDD Characterization Test Results
3.1
NDD Characterization Summary
3.2
Data Sheet Electrical Parameter Characteristics
4
Applicable and Reference Documents
4.1
Applicable Documents
4.2
Reference Documents
A Appendix: NDD Report Data
4.1
Applicable Documents
Texas Instruments,
TPS7H6005-SP Radiation-Hardness-Assured 200-V, 1.3A, 2.5A, Half-Bridge GaN FET Gate Driver
, data sheet.
Texas Instruments,
TPS7H6005EVM-CVAL Evaluation Module User's Guide
, EVM user's guide.