SNOU209 December 2024
There are multiple test points on the LMG2656EVM-102 daughtercard designed for analog and digital measurements with an oscilloscope. For a full list, refer to Table 2-1. Digital test points such as PWM, EN, and CS test points can be used to debug a system and understand how the device operates. However, note that the high signal ringing is expected. Long traces route these test points for easy measuring, but introduce parasitics that appear as high frequency noise during switching transitions. The test points are designed for observation only, and are useful for functional debugging with this daughtercard.
Measurements for these digital signals can have reduced parasitics and ringing by moving the oscilloscope probe near the associated device pin. A tip and barrel method is most accurate, and removes any unexpected signal noise.