SNVA925E January   2020  – March 2024 LM63610-Q1 , LM63615-Q1 , LM63625-Q1

 

  1.   1
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 HTSSOP Package
    2. 2.2 WSON Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 HTSSOP-16 Package
    2. 4.2 WSON Package
  6. 5Revision History

3 Failure Mode Distribution (FMD)

The failure mode distribution estimation for the LM636xx-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.

The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.

Table 3-1 Die Failure Modes and Distribution
Die Failure ModesFailure Mode Distribution (%)
No output voltage35%
Output not in specification -- voltage or timing45%
SW driver FET stuck on10%
RESET false trip or fails to trip5%
Short circuit any two pins5%