SNVK008 April   2024 TPS7H4011-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Biased Test Configuration and Condition
  6. 3TI Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
      1. 3.2.1 Electrical Characteristics
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix A: HDR Results Report at 100krad(Si)

2.2 Test Description and Facilities

The TPS7H4011-SP HDR exposure was performed on biased and unbiased devices in a Co-60 gamma cell at TI facility in Dallas, Texas. The unattenuated dose rate of this cell was 184.909rads(Si)/s . The 100krad(Si) biased and unbiased devices were annealed with the respective biased and unbiased condition for 168 hours and retested. The effective dose rate for these devices was 165 mrad(Si)/s. ATE test limits are set per data sheet electrical limits based on qualification and characterization data.