SNVK010 August 2024 TPS7H4011-SP
This report presents the effect of neutron displacement damage (NDD) on the Texas Instruments TPS7H4011-SP. The TPS7H4011-SP showed a strong degree of hardness to neutron irradiation up to fluence level 1 × 1013 n/cm2.
The neutron irradiation test is a destructive test. Test procedure follows MIL-STD-883 method 1017 as guidance. The purpose of this test is to determine the device susceptibility to non-ionizing energy loss (NIEL) degradation. Objectives of the test are, to detect and measure the degradation of critical device parameters as a function of neutron fluence and to determine if these parameters are within specified limits after exposure to a specified level of neutron fluence.