SNVU864 October 2023 TPS3762-Q1
Table 3-2 lists the test point connections and functional description for the device configuration. Test points are placed throughout the board to verify pin functionality.
PIN NUMBER / NAME | Test Point | Description |
---|---|---|
Pin 1 / VDD | TP1 | Test point TP1 connects to VDD. |
Pin 1 / J7 | TP2 | Test point TP2 connects to J7 pin 1. If a shunt jumper is connected to pins 1 & 2 of J7 then TP2 connects to SENSE. |
Pin 5 / BIST | TP3 | Test point TP3 connects to BIST. |
Pin 6 / BIST_EN / LATCH_CLR | TP4 | Test point TP4 connects to BIST_EN / LATCH_CLR. |
Pin 3 / GND | TP5 | Test point TP5 connects to GND. |
Pin 3 / GND | TP6 | Test point TP6 connects to GND. |
Pin 3 / GND | TP7 | Test point TP7 connects to GND. |
Pin 4 / RESET | TP8 | Test point TP8 connects to RESET. |
Pin 2 / SENSE | TP9 | Test point TP9 connects to SENSE. |
Pin 1 / J8 | TP10 | Test point TP10 connects to J8 pin 1. If a shunt jumper is connected to pins 1 & 2 of J8, then TP10 connects to RESET pullup (Used to set external RESET pull-up voltage). |
Pin 4 / J11 | TP11 | Test point TP11 connects to J11 pin 4. If a shunt jumper is connected to pins 3 & 4 of J11, then TP11 connects to BIST & BIST_EN / LATCH_CLR (Used to provide external pull-up voltage to these pins to clear faults). |