SNVU879 June 2024 LMR36503E-Q1
The test points on the top of the board can be used for connecting to the input and output of the EVM. See Table 3-1 for a description of the test points.
Test Point | Signal | Description |
---|---|---|
J1 | VIN_EMI | Input supply to EVM including an EMI filter. Connect to a good input supply. Connect at this point for conducted EMI test. |
GND_EMI | Ground connection for the input supply | |
TP1 | VIN | Input supply to the IC. Can be connected to DMM to measure input voltage after EMI filter |
TP2, TP3 | VOUT | Output voltage test point of EVM. Can be connected to a desired load |
TP4, TP5, TP6, TP7, TP11 | GND | Ground connection for the input supply as well as test points for ground connection |
TP8 | PGOOD | This test point is connected to the PGOOD pin from the IC. The test point is an open-drain output of the PGOOD pin. Using the jumper J3, the PGOOD pin can be tied to external supply through a pullup resistor or left open. |
TP9 | SYNC | In a MODE/SYNC trim part, this test point is connected to the SYNC pin of the IC. The test point can operate in user-selectable PFM/FPWM mode and can be connected to an external clock to synchronize the IC. Make sure R7 (RMODE) is installed and R5 (RT) is not installed. |
In a RT trim part, this test point is connected to the RT pin of the IC when the R4 (RMODE) is installed. | ||
TP10 | EN | This test point is connected to the EN pin. By default, there is a pullup resistor R2 to VIN to enable the IC. |