SPRAA99C March   2008  – May 2021 AM3351 , AM3352 , AM3354 , AM3356 , AM3357 , AM3358 , AM3359 , AM4372 , AM4376 , AM4377 , AM4378 , AM4379 , OMAPL138B-EP , TMUX646

 

  1.   Trademarks
  2. 1Introduction
  3. 2PCB Design Considerations
    1. 2.1 Solder Land Areas
    2. 2.2 Conductor Width/Spacing
    3. 2.3 High-Density Routing Techniques
    4. 2.4 Via Density
    5. 2.5 Conventional PCB Design
    6. 2.6 Advanced Design Methods
  4. 3Reliability
    1. 3.1 Reliability Calculations
    2. 3.2 Package Characteristics
    3. 3.3 Thermal Modeling
  5. 4Surface-Mounting nFBGA Packages
    1. 4.1 Design for Manufacturability (DFM)
    2. 4.2 Solder Paste
    3. 4.3 Solder Ball Collapse
    4. 4.4 Reflow
    5. 4.5 Inspection
  6. 5Packing and Shipping
    1. 5.1 Tray Packing Method
    2. 5.2 Tape-and-Reel Packing Method
    3. 5.3 Tape Format
    4. 5.4 Device Insertion
    5. 5.5 Packaging Method
  7. 6Sockets
    1. 6.1 The Design Challenge
    2. 6.2 Contacting the Ball
    3. 6.3 Pinch Contact
    4. 6.4 Micro Tuning Fork Contact
    5. 6.5 Texas Instruments Sockets
  8. 7Summary
  9.   A Frequently Asked Questions
    1.     A.1 Package Questions
    2.     A.2 Assembly Questions
    3.     A.3 Small Body nFBGA Package Questions
  10.   B Package Data Sheets
  11.   C Thermal Modeling Results
  12.   Revision History

Reliability Calculations

Another important aspect of predicting how a package will perform in any given application is reliability modeling. Thermal, electrical, and thermomechanical modeling, verified by experimental results, provide insight into system behavior, shorten package development time, predict system lifetimes, and provide an important analytical tool. In applications such as BGAs, where the interconnections are made through solder balls, the useful life of the package is, in most cases, dependent on the useful life of the solder itself. This is an area that has been studied extensively, and very accurate models for predicting both solder behavior and interpreting accelerated life testing exist.

The current methodology employed at Texas Instruments includes both extensive model refinement and constant experimental verification. For a given package, a detailed 2D finite element model (FEM) is constructed. This model is used to carry out 2D plain strain elastoplastic analysis to predict areas of high stress. These models also account for the thermal variation of material properties, such as modulus of elasticity, coefficient of thermal expansion, and Poisson’s Ratio as a function of temperature. These allow the FEM to calculate the thermomechanical plastic strains in the solder joints for a given thermal loading.

The combination of finite element analysis (FEA), accurate thermal property information, and advanced statistical methods allows prediction of the number of cycles to failure for various probability levels. Using the assumption that cyclic fatigue lifetime follows a Weibull distribution, various probability levels can be calculated. For these calculations, the Weibull shape parameter used is β = 4, which is based on experimental data calibration. It is also consistent with available experimental data found in the literature for leadless packages. This then results in Equation 1.

Equation 1. Nf(×%) = Nf(50%)[ln(1-0.01×)/ln(0.5)]1/β

Using Equation 1, and using the plastic strain ξp in combination with the S–N curves, the data below is an example of the accuracy possible with this method:

Sample Finite Element Simulation and Life Prediction:

144 GGU @ T/C: -40/125°C

{Model}→ ξp = 0.353% on the outmost joint → Nf(50%)= 4434 cycles

→ Nf(1%) = 1539 cycles

{BLR Testing}→ -40/125°C (10 min/10 min)

→ Nf(1%) = 1657 cycles

Modeling is most useful in exploring changes in materials, designs, and process parameters without the need to build experimental units. For example, modeling was used to study the effects of changes in board thickness and pad size. Table 3-5 shows the simulated effects of pad size and board thickness on the fatigue life of a 144-GGU package.

Table 3-5 Effects of Pad Size and Board Thickness on Fatigue Life
Example1: Effects of pad size on fatigue life
  • Package: 144 GGU
  • Die: 8.8 x 8.8 x 0.279 mm
  • Board: FR-4 board 52 mils thick
Pad Dia. (mils) Pad Standoff (mm) Solder Center Dia. (mm) Plastic Strain (%) Nf (1%) (cycles to failure) Difference
12 0.3847 0.4908 0.4400 998 0.88x
13 0.3689 0.4951 0.4127 1134 1
14 0.3523 0.5005 0.3908 1263 1.11x
15 0.3350 0.5060 0.3741 1377 1.21x
Example 2: Effects of board thickness on fatigue life
  • Package: 144 GGU
  • Die: 8.8 x 8.8 x 0.279 mm
  • Board: FR-4
  • Pad Size: 13 mils
Board Thickness (mils) Plastic Strain (%) Nf (1%) (cycles to failure) Difference
50 0.4095 1152 1
31 0.4095 1249 1.08x