SPRACF4C June   2018  – January 2023 AWR1243 , AWR1443 , AWR1642 , AWR1843 , AWR1843AOP , AWR2243 , AWR2944 , AWR6843 , AWR6843AOP , IWR1843 , IWR6443 , IWR6843 , IWR6843AOP

 

  1.   Trademarks
  2. 1Introduction
    1. 1.1 Purpose of Calibrations
    2. 1.2 Purpose of Monitoring Mechanisms
  3. 2Hardware Infrastructure to Support Calibration and Monitoring
  4. 3List of Calibrations
    1. 3.1  APLL Calibration
    2. 3.2  Synthesizer VCO Calibration
    3. 3.3  LO Distribution Calibration
    4. 3.4  ADC DC Offset Calibration
    5. 3.5  HPF Cutoff Calibration
    6. 3.6  LPF Cutoff Calibration
    7. 3.7  Peak Detector Calibration
    8. 3.8  TX Power Calibration
    9. 3.9  RX Gain Calibration
    10. 3.10 IQ Mismatch Calibration
    11. 3.11 TX Phase Shifter Calibration
  5. 4Impact of Calibration on Gain and Phase
  6. 5Impact of Interference on the Calibrations and Emissions Caused Due to Calibrations
  7. 6Scheduling of Runtime Calibration and Monitoring
    1. 6.1 Selection of CALIB_MON_TIME_UNIT
    2. 6.2 Selection of CALIBRATION_PERIODICITY
    3. 6.3 Application-Controlled One Time Calibration
  8. 7Software Controllability of Calibration
    1. 7.1  Calibration and Monitoring Frequency Limits
    2. 7.2  Calibration and Monitoring TX Frequency and Power Limit
    3. 7.3  Calibration Status Reports
      1. 7.3.1 RF Initialization Calibration Completion
      2. 7.3.2 Runtime Calibration Status Report
      3. 7.3.3 Calibration/Monitoring Timing Failure Status Report
    4. 7.4  Programming CAL_MON_TIME_UNIT
    5. 7.5  Calibration Periodicity
    6. 7.6  RF Initialization Calibration
    7. 7.7  Runtime Calibration
    8. 7.8  Overriding the TX Power Calibration LUT
    9. 7.9  Overriding the RX Gain Calibration LUT
    10. 7.10 Retrieving and Restoring Calibration Data
  9. 8References
  10.   A Calibration and Monitoring Durations
    1.     A.1 Duration of Boot Time Calibrations
  11.   Revision History

1.2 Purpose of Monitoring Mechanisms

To enable functional safety, such as in automotive applications, the monitoring mechanisms in the device can be configured to periodically provide the host processor with RF/analog health and diagnostic information. These mechanisms enable determination of RF/analog performance parameters and detection of failures arising from transistor and interconnect faults in the field. The diagnostic information they provide can also be helpful during development and optimization of designs integrating TI mmWave radar devices.